Patent · US Active

Parameter adjustment for pattern discovery

US10027686B2 · kind B2 · utility

1Cited by
10References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 30, 2012
Grant dateJul 17, 2018
Priority date
Expiry dateOct 20, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L43/04
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

Pattern discovery performed on event data may include selecting an initial set of parameters for the pattern discovery. The parameters may specify conditions for identifying a pattern in the event data. A pattern discovery run is executed on the event data based on the initial set of parameters, and a parameter may be adjusted based on the output of the pattern discovery run.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.