Adjusting an X-ray parameter of an X-ray unit

US10028719B1 · kind B1 · utility

Assignee

• Siemens Healthcare Limited · DE

Inventors

• Philipp Bernhardt · Forchheim, DE
• Rudolf Leiblein · Weisendorf, DE

Key dates

• Filing date: Dec 28, 2017
• Grant date: Jul 24, 2018
• Expiry date: Dec 28, 2037

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/306
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An X-ray projection of a region of examination and an associated X-ray parameter are received via an interface, the X-ray projection including X-ray intensities in a first pixel set. The X-ray parameter relates to at least one X-ray voltage from an X-ray source. Scattered radiation intensity is determined in a second pixel set, the second pixel set being a subset of the first pixel set. A first calculation of first exposure parameters in the second pixel set then occurs, each of the first exposure parameters in a pixel of the second pixel set being based on the X-ray intensity in the pixel and the scattered radiation intensity in the pixel. Furthermore, a second calculation of a scalar second exposure parameter occurs based on the first exposure parameters and an adjustment of the X-ray parameter is performed by comparing the scalar second exposure parameter with a reference value.