Speckle imaging device, speckle imaging system, and speckle imaging method
US10031023B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2016 |
| Grant date | Jul 24, 2018 |
| Priority date | — |
| Expiry date | Jan 14, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/479
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a highly accurate imaging technology that utilizes the speckle interference. The present technology provides a speckle imaging device including: an irradiation condition setting unit that sets an irradiation condition for coherent light with which an imaging object is irradiated; an imaging unit that captures scattered light obtained from the imaging object irradiated with the coherent light; an image generation unit that generates a speckle-enhanced image from a captured image captured by the imaging unit; and a leveling processing unit that generates a leveled speckle image from speckle-enhanced images corresponding to two or more different irradiation conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.