Optical thread profiler
US10036629B2 · kind B2 · utility
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11References
13Claims
0Family size
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Key dates
| Filing date | Mar 22, 2017 |
| Grant date | Jul 31, 2018 |
| Priority date | — |
| Expiry date | Mar 22, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.