Patent · US Active

Magnetic resonance system with position-dependent slew rate limitation

US10036792B2 · kind B2 · utility

0Cited by

2References

16Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventor

Heiko Meyer · Uttenreuth, DE

Key dates

Filing date	Jan 8, 2015
Grant date	Jul 31, 2018
Priority date	—
Expiry date	Nov 9, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/288
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A control facility of a magnetic resonance system receives parameters of a measuring sequence from an operator. The parameters define an activation of a gradient system of the magnetic resonance system. The control facility detects an exposure of at least one body region of the examination object brought about by the activation of the gradient system. The exposure is detected as a function of the position in which the examination object is disposed in an examination volume of the magnetic resonance system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.