Methods and apparatus for detecting and localizing partial conductor failures of implantable device leads
US10039919B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2014 |
| Grant date | Aug 7, 2018 |
| Priority date | — |
| Expiry date | Feb 2, 2035 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2560/0276
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Method and apparatus for diagnosis of conductor anomalies, such as partial conductor failures, in an implantable lead for an implantable medical device are disclosed. In various embodiments, small changes in the lead impedance are identified by the use of a small circuit element that is incorporated as part of the distal end of the implantable lead. In various embodiments, the small circuit element is electrically connected to a lead conductor and/or electrode of the implantable lead. Methods of diagnosing conductor anomalies in accordance with these embodiments generate measured values that depend only on the impedance of the conductors and electrodes of the lead, and not on the behavior of the conductor-tissue interface and other body tissues.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.