Modified eddy current probe for low conductivity surfaces
US10041812B1 · kind B1 · utility
1Cited by
1References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2017 |
| Grant date | Aug 7, 2018 |
| Priority date | — |
| Expiry date | Jan 24, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2201/10151
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A modified eddy current (MEC) probe includes a probe body having a bore formed therein. A printed circuit board (PCB) assembly includes a circuit board defining a plane, has a plurality of electronic components mounted thereon, and is configured for mounting within the bore of the probe body. A coil board assembly is electrically connected to the PCB assembly and comprises a coil board defining a plane, a transmitter coil formed on a first side of the coil board, and a sensor coil formed on second side of the coil board. The plane of the coil board is arranged orthogonally to the plane of the circuit board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.