Automatic probe ground connection checking techniques
US10041975B2 · kind B2 · utility
3Cited by
9References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2015 |
| Grant date | Aug 7, 2018 |
| Priority date | — |
| Expiry date | Feb 7, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/54
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.