Multi-focal structured illumination microscopy systems and methods
US10042149B2 · kind B2 · utility
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Key dates
| Filing date | Jun 1, 2017 |
| Grant date | Aug 7, 2018 |
| Priority date | — |
| Expiry date | Jun 1, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0633
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample is disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.