Test device and method of manufacturing the same, display apparatus
US10042222B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 19, 2015 |
| Grant date | Aug 7, 2018 |
| Priority date | — |
| Expiry date | Jan 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136254
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The present invention discloses a test device, a method of manufacturing the test device, and a display apparatus. The test device comprises a first test electrode and a second test electrode. The first test electrode is configured to electrically connect with an electrode layer of an array substrate, and the electrode layer is a gate electrode layer or a source-drain electrode layer. The second test electrode is configured to electrically connect with a first transparent conductive layer provided on the array substrate, and the first transparent conductive layer is electrically connected to a second transparent conductive layer provided on a color film substrate. Thereby, it is possible to test liquid crystal characteristics of the whole liquid crystal display panel by applying a DC voltage through the first test electrode and the second test electrode. Thereby, the test of the whole liquid crystal display panel may be directly finished under factory conditions without using the small liquid crystal test box or the like self-made in a laboratory. In this way, the testing result becomes more accurate, the testing process becomes more rapid, and the testing cost becomes lower.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.