Method for determining wave-front aberration data of a to-be-tested optical system
US10045690B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 9, 2014 |
| Grant date | Aug 14, 2018 |
| Priority date | — |
| Expiry date | Jan 9, 2035 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B3/0025
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for determining wave-front aberration data of a to-be-tested optical system comprising the steps of: a) providing a wave-front sensing image of light received from the tested optical system; b) providing a model representative of the optical system with at least an optical parameter representative of said model; and c) optimizing a set of wave-front coefficient data and said at least optical parameter of said model according to a merit function calculating the merit function comprises the steps of generating a wave-front sensing modeled image of light received from said model by the at least optical parameter and the set of wave-front coefficient data, and calculating a criteria based on shape parameter data of the wave-front sensing image and shape parameter data of the wave-front sensing modeled image, so as to obtain wave-front aberration data of the tested optical system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.