Improvements relating to particle characterisation
US10048187B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 4, 2014 |
| Grant date | Aug 14, 2018 |
| Priority date | — |
| Expiry date | Nov 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4711
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle characterization apparatus is disclosed comprising: a light source; a sample cell; a collecting lens and a detector. The light source is operable to illuminate a sample comprising dispersed particles within the sample cell with a light beam along a light beam axis. The light beam axis passes through a first wall of the sample cell, through the sample, and through a second wall of the sample cell, so as to produce scattered light by interactions with the sample. The detector is configured to detect light scattered from the sample. The second wall of the sample cell comprises a lens with a convex external surface through which the light beam axis passes. The collecting lens is arranged to collect and focus scattered light leaving the sample cell onto the detector, and comprises an aspheric surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.