Methods for generating a negative test input data and devices thereof
US10049032B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 4, 2014 |
| Grant date | Aug 14, 2018 |
| Priority date | — |
| Expiry date | Jan 9, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method and system for generating negative test input data. A set of attributes and a set of attribute properties can be extracted from a requirement specification. A constraint representation syntax can be framed from the extracted set of attribute properties. A structured diagram is modeled from the framed constraint representation syntax and a set of use cases, a set of path predicates can be constructed from the structured diagram. One or more attribute classes can be determined from the set of path predicates based on an attribute constraint and an attribute dependency. The negative test input data shall be generated from the one or more attribute classes using genetic algorithm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.