Reflector arrangement with retroreflector and with a sensor arrangement for inclination determination and calibration
US10054439B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 7, 2015 |
| Grant date | Aug 21, 2018 |
| Priority date | — |
| Expiry date | Dec 7, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/86
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Reflector arrangement for position determination and/or marking of target points, in particular for industrial or geodetic surveying, having a retroreflector for position determination for the reflector arrangement using parallel, in particular coaxial, beam reflection, and a sensor arrangement. According to the invention, the sensor arrangement has a lens and a sensor which is sensitive with respect to at least one wavelength range, with a reception direction that is orthogonal to the detection surface thereof, wherein the lens and the sensor are rigidly connected such that it is possible using the sensor to determine a location, which is incidence-angle-dependent with respect to the reception direction, of an illumination cross section defined by the lens on the detection surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.