Infrared spectroscopic imaging microscope with an attenuated total reflection imaging sub-assembly
US10054782B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Sep 20, 2016 |
| Grant date | Aug 21, 2018 |
| Priority date | — |
| Expiry date | Feb 23, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An imaging microscope for spectrally analyzing a sample includes (i) a laser source that generates an interrogation beam; (ii) an attenuated total reflection assembly that includes an ATR crystal and a sample holder that holds the sample in intimate contact with the ATR crystal; (iii) an objective lens assembly that collects a reflected beam and focuses the reflected beam; and (iv) a two dimensional image sensor that receives the focused, reflected beam and captures two dimensional image information that is used to generate an image of the sample, the image sensor being operable in the mid-infrared range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.