Detection and signal processing system for particle assays
US10060847B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2016 |
| Grant date | Aug 28, 2018 |
| Priority date | — |
| Expiry date | Feb 23, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1488
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for detecting and processing signals from particles. In an exemplary method, particles may be passed through a zone of a channel, while the zone is irradiated with light. Interaction of the light with the particles may deflect light and induce photoluminescence. A deflection signal and a photoluminescence signal may be detected from the zone. Particle waveforms may be identified in the deflection signal. At least a subset of the particle waveforms may be double-peak waveforms including a pair of peaks corresponding to a particle entering and exiting the zone. Amplitudes may be obtained from the photoluminescence signal. The amplitudes may correspond to respective particles and their particle waveforms, and at least a subset of the amplitudes may correspond to the double-peak waveforms. Individual particles may be assigned as positive or as negative for an analyte based on the corresponding amplitudes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.