Test circuits for integrated circuit counterfeit detection
US10060973B1 · kind B1 · utility
4Cited by
9References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 22, 2015 |
| Grant date | Aug 28, 2018 |
| Priority date | — |
| Expiry date | Sep 12, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L9/3255
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.