Nonvolatile memory device and program method and program verification method thereof
US10061633B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 16, 2016 |
| Grant date | Aug 28, 2018 |
| Priority date | — |
| Expiry date | Sep 2, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/0483
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A program verification method for a nonvolatile memory device includes performing a first failure bit counting operation about a first stage to generate a first failure bit accumulated value and comparing the first failure bit accumulated value and a first failure reference value to determine a program failure. When the first failure bit accumulated value is less than the first failure reference value, a second failure bit counting operation for a second stage is performed to generate a second failure bit accumulated value. The second failure bit accumulated value is compared to a second reference value to determine a program failure. The second failure reference value is different from the first failure reference value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.