Automated metrology and model correction for three dimensional (3D) printability
US10061870B2 · kind B2 · utility
10Cited by
4References
21Claims
0Family size
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Key dates
| Filing date | Mar 18, 2014 |
| Grant date | Aug 28, 2018 |
| Priority date | — |
| Expiry date | Nov 5, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and a method automate metrology, measurement, and model correction of a three dimensional (3D) model for 3D printability. Slices of the 3D model are received or generated. The slices represent 2D solids of the 3D model to be printed in corresponding print layers. Medial axis transforms of the slices are calculated. The medial axis transforms represent the slices in terms of corresponding medial axes. A local feature size at any point along a boundary of the slices is determined as the shortest distance from the point to a corresponding medial axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.