Method for mapping crystal orientations in a sample made of a polycrystalline material
US10062145B2 · kind B2 · utility
2Cited by
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23Claims
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Key dates
| Filing date | Jan 23, 2015 |
| Grant date | Aug 28, 2018 |
| Priority date | — |
| Expiry date | May 8, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10152
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for mapping the crystal orientations of a polycrystalline material, the method comprising:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.