Point cloud processing apparatus and method
US10066925B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 2, 2016 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Sep 25, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30156
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A computer implemented method may include the steps of: (1) providing a first point cloud representative of at least a bare portion of a surface of an object relative to a reference portion of the surface, (2) providing a second point cloud representative of at least a coated portion of the surface relative to the reference portion, (3) registering the first point cloud and the second point cloud with respect to a common reference coordinate system, (4) registering a first reference portion subset of the first data points representative of the reference portion and a second reference portion subset of the second data points representative of the reference portion, and (5) calculating difference values indicative of a thickness of the surface coating based on differences between a coated portion subset of the second data points and a bare portion subset of the first data points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.