Electronic device inspecting system and method
US10067065B1 · kind B1 · utility
5Cited by
4References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2014 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Aug 24, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/958
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A cover glass of an electronic device may be inspected for defects and damage such as cracks, fractures, scratches, and chips. The electronic device may be placed in an enclosure with a lighting assembly that emits light to the electronic device, and scattered light from defects and damage of the cover glass is captured by an imaging device. A shutter assembly facilitates the capture of scattered light and reduces the capture of reflected light, which enhances the exposure of defects and damage of the captured image of the cover glass. A mirror facilitates the capture of a side surface of the electronic device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.