Patent · US Active

Method and particle analyzer for measuring a low concentration particle sample

US10067150B2 · kind B2 · utility

0Cited by
3References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 28, 2011
Grant dateSep 4, 2018
Priority date—
Expiry dateFeb 2, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2035/00465
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and particle analyzer for measuring a low concentration particles sample disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.