Method and apparatus for generating featured test pattern
US10067186B2 · kind B2 · utility
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4References
18Claims
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Key dates
| Filing date | Sep 10, 2016 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Oct 11, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/1202
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An method of generating a featured scan pattern for test includes: providing a plurality of predetermined test patterns to perform test on a plurality of devices under test (DUT) under a stress condition to generate a plurality of test responses of each DUT; grouping a plurality of specific test responses of each DUT from the test responses of each DUT to determine a feature value corresponding to a failure feature for each DUT; and generating at least one featured test pattern according to the feature value of each DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.