System and method for occluding contour detection
US10067509B1 · kind B1 · utility
19Cited by
60References
18Claims
0Family size
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Key dates
| Filing date | Aug 31, 2017 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Aug 31, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/19173
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system method for occluding contour detection using a fully convolutional neural network is disclosed. A particular embodiment includes: receiving an input image; producing a feature map from the input image by semantic segmentation; applying a Dense Upsampling Convolution (DUC) operation on the feature map to produce contour information of objects and object instances detected in the input image; and applying the contour information onto the input image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.