Inspection system
US10068322B2 · kind B2 · utility
3Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2013 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Dec 22, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30252
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One or more techniques and/or systems are described for inspecting an object, such as a tire. The system comprises a radiation imaging system configured to examine the object via radiation to generate a radiation image depicting an interior aspect of the object and a machine vision system configured to measure visible light and/or infrared wavelengths to generate a vision image depicting an exterior aspect of the object. The radiation image and the vision image may be correlated to facilitate an inspection of the object which includes an inspection of the exterior aspect as well as the interior aspect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.