System and method for enhancing visual inspection of an object
US10068326B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2016 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Oct 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting an object to assist in determining whether the object has a surface defect. The method includes moving the object in a first direction and illuminating the object under ambient lighting conditions. The method also includes capturing at least one image of the object under the ambient lighting conditions while the object moves in the first direction. In addition, the object is illuminated under object lighting conditions and at least one image of the object under the object lighting conditions is captured while the object moves in the first direction to provide at least one object image. Further, the method includes selecting at least one object image having at least one indication of a possible defect to provide images having defect candidates and comparing the defect candidates with previously defined characteristics associated with the defect to facilitate determination of whether a defect exists.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.