Tire uniformity improvement through modified sampling of uniformity parameters
US10073009B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 8, 2013 |
| Grant date | Sep 11, 2018 |
| Priority date | — |
| Expiry date | Mar 8, 2034 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29D2030/0635
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
Methods and systems for improving tire uniformity through identification of uniformity attributes, such as process harmonics are provided. More particularly, uniformity measurements acquired according to a non-uniform sampling pattern can be obtained and analyzed to estimate one or more process harmonics (e.g. the magnitude of the process harmonic). The non-uniform sampling pattern can specify the acquisition of uniformity measurements in a varying or irregular manner about one or more revolutions of the tire. For instance, the non-uniform sampling pattern can specify a random spacing between data points. The uniformity attributes estimated from the uniformity measurements can be used to modify the manufacture of tires to improve tire uniformity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.