Method, system and assembly for determining a reduction of remaining service lifetime of an electrical device during a specific time period of operation of the electrical device
US10073130B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2015 |
| Grant date | Sep 11, 2018 |
| Priority date | — |
| Expiry date | Nov 7, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01F2027/406
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining a reduction of remaining service lifetime of an electrical device during a specific time period. The method comprising the steps of providing a measurement system comprising a temperature measurement device; a current measurement device and a voltage measurement device; measuring a temperature value, voltage values and current values by using the measurement device; determining a harmonic load based on the current values; determining a reduced maximum operating temperature based on the harmonic load; determining an amount of transient over-voltages based on the voltage values; determining a transient aging factor based on the amount of transient over-voltages; determining a temperature dependent aging factor based on the temperature value and the reduced maximum operating temperature; and determining the reduction of remaining service life based on the specific time period, the transient aging factor and the temperature dependent aging factor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.