Fast hall effect measurement system
US10073151B2 · kind B2 · utility
3Cited by
4References
31Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 12, 2017 |
| Grant date | Sep 11, 2018 |
| Priority date | — |
| Expiry date | Oct 12, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/072
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for measuring Hall effect in a material includes measuring a voltage in two test states, each state alternating the direction and orientation of a current applied across the material or the voltage measured across the material relative to a magnetic field in each state. According to an embodiment, the frequency of measurement at each state differs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.