Patent · US Active

Method and system for testing circuit

US10073506B2 · kind B2 · utility

0Cited by

3References

21Claims

0Family size

Assignee

Delta Electronics, Inc. · TW

Inventors

Jianhong Zeng · Shanghai, CN
Ziying Zhou · Shanghai, CN
Haoyi Ye · Shanghai, CN
Peiqing Hu · Taoyuan, CN

Key dates

Filing date	Sep 29, 2015
Grant date	Sep 11, 2018
Priority date	—
Expiry date	Mar 23, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01R19/16552
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present disclosure generally relates to a test method and system thereof. The test method comprises: outputting a test control signal to a test power supply of the circuit under test so as to adjust an input signal of the circuit under test so that a gain range of the circuit under test in an abnormal operating state is the same as that of the circuit under test in a normal operating state when the circuit under test enters into the abnormal operating state. The present disclosure may meet requirements for equipment test without sacrificing the efficiency of circuits in normal operating state or adding complexity circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.