Patent · US Active

Systems and methods for rapidly screening samples by mass spectrometry

US10074526B2 · kind B2 · utility

1Cited by
6References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 2, 2016
Grant dateSep 11, 2018
Priority date
Expiry dateDec 2, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/04
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Systems and methods are used to rapidly screening samples. A fast sample introduction device that is non-chromatographic is instructed to supply each sample of a plurality samples to a tandem mass spectrometer using a processor. The fast sample introduction device can include a flow injection analysis device, an ion mobility analysis device, or a rapid sample cleanup device. The tandem mass spectrometer is instructed to perform fragmentation scans at two or more mass selection windows across a mass range of each sample of the plurality of samples using the processor. The two or more mass selection windows across the mass range can have fixed or variable window widths. The tandem mass spectrometer can be instructed to obtain a mass spectrum of the mass range before instructing the tandem mass spectrometer to perform the fragmentation scans.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.