Predicting solid state drive reliability
US10078455B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jan 20, 2016 |
| Grant date | Sep 18, 2018 |
| Priority date | — |
| Expiry date | Jan 20, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0683
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspects extend to methods, systems, and computer program products for predicting solid state drive reliability. Aspects of the invention can be used to predict and/or to configure a data center to minimize one or more of: SSD capacity degradation (how much storage an SSD has left), SSD performance degradation (reduced read/write latency/throughput), and SSD failure. Models and data center considerations can be based on device level SSD related operations, such as, for example, read, write, erase. Operations decisions can be made for a data center based on SSD specific features, such as, for example, remaining capacity, write amplification factor, etc. Dependence and/or causality of various different data center factors can be leveraged. The impact of the various data center factors on different SSD failure modes and capacity/performance degradation can be quantified to drive SSD design, SSD provisioning, and SSD operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.