Apparatus and method for an on-chip reliability controller
US10078544B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2015 |
| Grant date | Sep 18, 2018 |
| Priority date | — |
| Expiry date | Dec 19, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/27
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus and method are described for an on-chip reliability controller. For example, one embodiment of a processor comprises: a set of one or more cores to execute instructions and process data; a reliability controller to perform one or more self-test/diagnostic operations, the reliability controller to aggregate reliability data resulting from the self-test/diagnostic operations; a reliability estimator integral to the reliability controller to use the aggregated reliability data to perform a probability analysis to determine reliability estimates for one or more components of the processor; and a control unit integral to the reliability controller to adjust one or more variables and/or circuitry related to operation of the processor responsive to the reliability estimates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.