Sampling probes, systems, apparatuses, and methods
US10082518B2 · kind B2 · utility
2Cited by
29References
40Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2016 |
| Grant date | Sep 25, 2018 |
| Priority date | — |
| Expiry date | Apr 1, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N35/0099
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sampling system is provided. The sampling system includes a housing. Mounted to the housing is a Hall effect sensor. A probe configured to contact a sample is inserted into the housing. The probe includes an elongated portion and a restorative spring inserted onto the elongated portion of the probe. The restorative spring provides sufficient restorative force to return the probe to a relaxed position. The Hall effect sensor is configured to sense a field strength generated by the proximity of the restorative spring of the probe in the extended position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.