Array substrate for X-ray detector and X-ray detector comprising the same
US10082585B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 27, 2016 |
| Grant date | Sep 25, 2018 |
| Priority date | — |
| Expiry date | Dec 27, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/8037
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
The present disclosure relates to an array substrate for an X-ray detector and an X-ray detector including the same. The array substrate is defined as an active area and a pad area, wherein the pad area comprises a plurality of test areas comprising a first test pattern and a second test pattern, the first test pattern comprises a first gate electrode on a substrate, a first active layer on the first gate electrode, a first source/drain electrode on the first active layer, and a first data line on the first source/drain electrode, and the second test pattern comprises a first lower electrode on the substrate, a first photoconductive layer on the first lower electrode, and a first upper electrode on the first photoconductive layer, thereby measuring the characteristic of each of a transistor and an optical detector with high accuracy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.