Dual magnification apparatus and system for examining a single objective in a scanning optical microscope using two wavelengths of light
US10082657B2 · kind B2 · utility
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9References
12Claims
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Key dates
| Filing date | Jun 15, 2017 |
| Grant date | Sep 25, 2018 |
| Priority date | — |
| Expiry date | Jun 15, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.