Wafer-scale pixelated detector system
US10084983B2 · kind B2 · utility
2Cited by
18References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 27, 2016 |
| Grant date | Sep 25, 2018 |
| Priority date | — |
| Expiry date | Aug 3, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/811
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A large area, gapless, detection system comprises at least one sensor; an interposer operably connected to the at least one sensor; and at least one application specific integrated circuit operably connected to the sensor via the interposer wherein the detection system provides high dynamic range while maintaining small pixel area and low power dissipation. Thereby the invention provides methods and systems for a wafer-scale gapless and seamless detector systems with small pixels, which have both high dynamic range and low power dissipation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.