Grain quality sensor
US10085379B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 12, 2017 |
| Grant date | Oct 2, 2018 |
| Priority date | — |
| Expiry date | Sep 12, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/80
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A grain quality sensor comprising a photosite array, an illumination source, a filter, and an electronics module, wherein the illumination source directs light onto a crop sample, wherein the filter limits passage of light into different parts of the photosite array such that certain locations on the photosite array only receive certain wavelengths of light reflected or fluoresced by the crop sample, wherein an electronics module is electrically connected to the photosite array and capable of determining which parts of the photosite array received light and the wavelengths of the light received, wherein the electronics module can analyze the optical data received by the photosite array, and wherein the analysis of the optical data is used to determine the composition of the crop sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.