Patent · US Active

Measuring device and measuring arrangement

US10088351B2 · kind B2 · utility

1Cited by

4References

6Claims

0Family size

Assignee

KROHNE Messtechnik GmbH · DE

Inventors

Michael Gerding · Bochum, DE
Bjorn Schafer · Bochum, DE

Key dates

Filing date	Sep 9, 2016
Grant date	Oct 2, 2018
Priority date	—
Expiry date	Dec 10, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01D21/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measuring arrangement and a measuring device having a sensor device, a processing device, a storage device, an interface and a control device that allows for a simplified testing of the functionality of the measuring device is achieved in that the control device retrieves externally provided data via the interface and performs a test of the measuring device. The test thereby involves the control device determining a reference value from the externally provided data, comparing the reference value to a measured value generated by the processing device and generating a comparison result based thereupon. Alternatively, the test involves the control device using the externally provided data for the generation of new calculation data to be stored in the storage device and storing the new calculation data in the storage device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.