Method and device for material analysis
US10088441B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2015 |
| Grant date | Oct 2, 2018 |
| Priority date | — |
| Expiry date | Dec 30, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49828
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and thermal analysis device including a sample holder and at least one temperature detector which is assigned to the holder. The invention further relates to a production method for a temperature detector. A heat flow to be detected is conveyed to the temperature detector between a support surface and the sample holder, wherein the support surface and/or the sample holder include elevations or depressions forming contact points, which define a relevant heat flow zone assigned to the support surface. A thermocouple, which includes at least two elements made of different metals, a first metallic element A, with a higher expansion coefficient compared to a second metallic element B, is introduced in a precisely fitting manner into second metallic element B constituted as a hollow profile and the two elements A, B are heated in a first operational step and then cooled again in a second operational step.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.