Patent · US Active

Test probes for smart inspection

US10090914B2 · kind B2 · utility

2Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 13, 2015
Grant dateOct 2, 2018
Priority date
Expiry dateAug 6, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/945
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

One or more embodiments are directed to apparatuses and methods of evaluating an endface of an optical communication link, such as a fiber optic cable. In at least one embodiment, a camera probe includes an imaging device that includes one or more feedback mechanisms, such as an alignment feedback mechanism that communicates alignment information regarding an alignment of the optical communication link under test with an image sensor of the camera probe. The alignment feedback mechanism may be visual and/or aural. The alignment feedback mechanism may provide directional information to the user indicative of a direction to move the imaging device relative to the optical communication link. In addition or alternatively, the feedback mechanism may include a focus feedback mechanism that communicates focus information regarding a focus of the endface in an obtained image of the endface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.