Systems, devices, and methods for calibrating a light field projection system
US10091496B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2016 |
| Grant date | Oct 2, 2018 |
| Priority date | — |
| Expiry date | Apr 17, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N13/363
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to systems, devices, and methods for calibrating a light field projection system. One example system includes a projection unit operable to project a scanning sequence toward a screen having convex reflective elements. The scanning sequence is modulated according to a baseline intensity profile. The system also includes a calibration device disposed such that a portion of the scanning sequence is intercepted by the calibration device. The calibration device includes a first light detector arranged to detect an intercepted intensity profile. The calibration device also includes a second light detector arranged to detect a reflected portion of the scanning sequence as a measured intensity profile. The system further includes a control system. The control system is configured to determine an expected intensity profile and to modify operation of the light field projection system based on a comparison of the measured intensity profile to the expected intensity profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.