Method and system for gas temperature measurement
US10094714B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2016 |
| Grant date | Oct 9, 2018 |
| Priority date | — |
| Expiry date | Apr 8, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/0887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature measurement system includes at least one temperature measurement probe. The at least one temperature measurement probe includes at least one hollow filament configured to emit thermal radiation in a predetermined and substantially continuous wavelength band at least partially representative of a temperature of the at least one hollow filament. The at least one hollow filament has a first diameter and a first emissivity. The at least one temperature measurement probe also includes at least one thin filament extending within at least a portion of the at least one hollow filament. The at least one thin filament is configured to emit thermal radiation in a predetermined and substantially continuous wavelength band at least partially representative of a temperature of the at least one thin filament. The at least one thin filament has a second emissivity and a second diameter less than the first diameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.