Testing of clock and data recovery circuits
US10097341B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 30, 2017 |
| Grant date | Oct 9, 2018 |
| Priority date | — |
| Expiry date | Aug 30, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L7/0083
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A device comprises a clock data recovery (CDR) circuit. The CDR circuit has an input node to receive an input data signal, an output node, a data recovery circuit, and a self-test circuit. The CDR circuit supports a first mode of operation and a second mode of operation. In the first mode, the CDR circuit receives the input data signal at the input node and provides the input data signal to an input of the data recovery circuit, the data recovery circuit recovers first data from the input data signal, and the CDR circuit provides the first data for output at the output node. In the second mode, the self-test circuit generates a test data pattern which is provided to the output node and looped back to the input of the data recovery circuit, the data recovery circuit recovers second data from the test data pattern, and the self-test circuit checks the second data for errors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.