Patent · US Active

Method and device for detecting deviations of an object surface

US10101153B2 · kind B2 · utility

0Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 2013
Grant dateOct 16, 2018
Priority date
Expiry dateAug 17, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T17/30
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a method for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data. A surface description, at least portions of which are parametric, is generated as a target surface model using the specified reference data, and the comparison is carried out using the target surface model and the measured data. The invention likewise relates to a device for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.