Method and device for detecting deviations of an object surface
US10101153B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 25, 2013 |
| Grant date | Oct 16, 2018 |
| Priority date | — |
| Expiry date | Aug 17, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T17/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data. A surface description, at least portions of which are parametric, is generated as a target surface model using the specified reference data, and the comparison is carried out using the target surface model and the measured data. The invention likewise relates to a device for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.