Method for desiging freeform surface imaging optical system
US10101204B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 11, 2017 |
| Grant date | Oct 16, 2018 |
| Priority date | — |
| Expiry date | Oct 11, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/283
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An initial system and a constraint condition are established. All freeform surfaces are obtained by surface fitting the feature data points to form a first freeform surface imaging optical system. The first freeform surface imaging optical system is taken as the initial system for multiple iterations to obtain a second freeform surface imaging optical system. The second freeform surface imaging optical system is taken as a first base system. A first surface freedom of the first base system is selected, the values nearby the first surface freedom is selected, and surface positions and tilts of the first base system are changed to obtain a third freeform surface imaging optical system that satisfies the constraint condition. A second base system is selected and the method above is repeated. The freeform surface imaging optical system is obtained until all freedoms for surface positions and tilts have been used.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.