Patent · US Active

Temperature monitoring

US10101214B2 · kind B2 · utility

1Cited by

0References

18Claims

0Family size

Assignee

NXP B.V. · NL

Inventors

Friso Jacobus Jedema · Eindhoven, NL
Romano Hoofman · Leuven, BE
Jan Rene Brands · Eindhoven, NL

Key dates

Filing date	Jun 4, 2015
Grant date	Oct 16, 2018
Priority date	—
Expiry date	Sep 18, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01K11/06
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Aspects of the present disclosure relate to phase-change materials. In accordance with an example embodiment, a phase-change material has a crystalline structure that manifests changes that increase as a function of time. For example, such changes may be implemented for monitoring the time that a perishable item has been exposed to an environment having a temperature that is greater than a threshold temperature. Based on the changes, a characterization is provided, indicative of the exposure of the phase-change material to the environment having the temperature that is greater than the threshold temperature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.