Apparatus and method for measuring noise
US10101242B2 · kind B2 · utility
2Cited by
5References
14Claims
0Family size
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Key dates
| Filing date | Jun 21, 2016 |
| Grant date | Oct 16, 2018 |
| Priority date | — |
| Expiry date | Nov 16, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01H13/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring noise includes: a signal generator configured to input an input signal having an excitation frequency to an audio device; and a controller configured to measure rattle noise from a sound pressure signal generated in response to the input signal. The controller measures the rattle noise by comparing a frequency component of the sound pressure signal with a masking curve corresponding to the excitation frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.