Patent · US Active

Analytical test management system and method

US10101349B2 · kind B2 · utility

5Cited by
1References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2016
Grant dateOct 16, 2018
Priority date
Expiry dateApr 20, 2037

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test management system is presented. The system comprises an analyzer to perform tests a sample according to a first set of instructions, a manager module connected to the analyzer, and a first order interface connected to the manager module. The manager module directs activity of the analyzer according to a second set of instructions. The first order interface receives an order for a first analytical test and a second analytical test and transmits the order to the manager module. If the order is for the first analytical test, the test manager module forwards the order directly to the analyzer and the sample is analyzed by the analyzer according to the first set of instructions. If the order is for the second analytical test, the manager module handles the order according to the second set of instructions and generates and transmits secondary test requests to the analyzer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.